TITLE: Equivalency of
Accelerated Life Testing Plans under Different Stress Loadings

SPEAKER: Professor
E. A. Elsayed

ABSTRACT:

Accelerated Life
Testing (ALT) is designed and conducted to obtain failure observations in a
short time by subjecting test units to severer than normal operating conditions
and use the data for reliability prediction. Many types of stress loadings such
as constant-stress, step-stress and cyclic-stress can be utilized when
conducting ALT. Extensive research has been conducted on the analysis of ALT
data obtained under constant stress loading. However, the equivalency of ALT
experiments involving different stress loadings has not been investigated. In
this paper, we provide definitions for the equivalency of test plans, general
equivalent ALT plans and some special types of equivalent ALT plans are explored.
For demonstration, a constant-stress ALT and a ramp-stress ALT for miniature
lamps are presented and their equivalency is investigated.